DUAL-HEAD 3D SENSORS
ACCURATE, SHADOW-FREE SCANNING
The Dual-Head ECCO 95+ models deliver competitive two camera 3D sensors for applications where shadow free 3D scanning is essential. Providing 3D laser scanning for customers where previously 3D laser scanning was not a viable solution due to occlusions. Ultra-high resolution paired with superior image quality for best performance under challenging conditions.
Properties & Benefits
SmartRay™
Dual-Head ECCO 95.200+
| Typical field of view (near | mid | far) 1 | 125 | 205| 285 mm |
|---|---|
| Typical measurement range 1 | 300 mm (+125 mm, -175 mm) |
| Stand-off distance | 320 mm |
| Typical vertical resolution (Z) 1 | 13.7-60 μm |
| Typical lateral resolution (Y) 1 | 65-148 μm |
| Z-linearity 2, 5 | 0.015 % |
| Z-repeatability 4, 5 | 3.3 μm |
| weight | Approx. 1350g |
| part numbers |
3.005.604 (laser class 2) 3.008.604 (laser class 3R) |
| Maximum points / 3D profile | 3840 |
|---|---|
| Typical scan rate 3 | Approx. from 1 kHz up to 10 kHz |
| Typical 3D point rate 3 | Approx. from 0.7 up to 15 million points/sec |
| Interface | Gigabit Ethernet ( 1 Gbit/ sec) |
| Inputs | 2x Inputs (5 – 24 VDC) Quadrature Encoder (AB-Channel, RS-422 standard) |
| Outputs | 2 x Outputs, 24 VDC (max. 20 mA) |
| Trigger | START Trigger support on Input 1 – 2 DATA Trigger support on Quadrature Encoder Input (Max. DATA trigger rate: 1 MHz) DATA Trigger support on Input 2 (Max. DATA trigger rate: 10 kHz) |
| Input voltage | Power | 24 VDC ± 15% 17W |
| Laser wavelength | 660 nm |
| Laser class (standard | optional) | 2M | 3R |
| EMC test | as per EN 61 000-6-2, EN 61 000-6-4, EN 61326-1:2013-07 |
| Laser safety inputs | 24 VDC | 0V |
| Electrical safety | as per EN 61 010-1-3 |
| Protection class | III, as per EN 61 040-3 |
| Enclosure rating | IP65 |
| Air humidity | Maximum 90%, non-condensing |
| Temperature (operation | storage) | 0 – 40° C | -20 – 70° C |
| Compatible accessories | Power-I/O-Encoder cable: 6.320.0XX Ethernet cable: 6.303.0XX Y-Encoder Cable: 6.445.003 |
(1) Typical values can vary up to 5% due to optical tolerances
(2) Z-Linearity calculated as a variation of “bias” (reference value vs. measured value) over the measurement range. The %slope of a best-fit (regression) line from a plot of bias over measurement range represents Z-Linearity
(3) Scan rate & point rate are dependent on the configured field of view, measurement range and exposure time. The typical scan/point rate has been estimated with an exposure time of 1 µsec
(4) Experimentally asessed by scanning a measurement target moving over a conveyor belt 50 times. Measurement perfomed by averaging height values within the Z-Map image. No post-processing filters applied
(5) Measurements performed on a SmartRay standard artifact which is an aluminium flat matt surface painted matte white