ECCO X
FAST – FLEXIBLE – COMPACT
The new ECCO X model delivers exceptional speed and resolution in an extraordinary compact design. Providing 3D laser scanning for customers where previously 3D laser triangualtion was not a viable solution due to speed or resolution issues. Ultra-high definition paired with high speed for best performance under challenging conditions.
Properties & Benefits
SmartRay™
ECCO X 025 Dual-Head
| Typical field of view (near | mid | far) 1 | 22| 25| 28mm |
|---|---|
| Typical measurement range 1 | 20 mm |
| Stand-off distance | 64 mm |
| Typical vertical resolution (Z) 1 | 0.9-1.4 μm |
| Typical lateral resolution (Y) 1 | 5-7 μm |
| Z-linearity 2, 5 | 0.005 % |
| Z-repeatability 4, 5 | 0.2 μm |
| weight | Approx. 1500g |
| part number | 3.002.210 (LC 2) | 3.004.210 (LC 3R) |
| Maximum points / 3D profile | 2 x 4096 |
|---|---|
| Typical scan rate 1 | Up to 40 kHz |
| Typical 3D point rate 1 | Up to 2 x 163 million points/sec |
| Interface | 2x Gigabit Ethernet ( 1 Gbit/ sec) |
| Inputs | 2 x Inputs (5 – 24 VDC) Quadrature Encoder (AB-Channel, RS-422 standard) |
| Outputs | 2 x Outputs, 24 VDC (max. 20 mA) |
| Trigger | START Trigger support on Input 1 DATA Trigger support on Quadrature Encoder Input (Max. DATA trigger rate: 1 MHz) DATA Trigger support on Input 2 (Max. DATA trigger rate: 5 kHz) |
| Input voltage | Power | 24 VDC, ± 15% | 20 W |
| Laser wavelength | 450 nm (brilliant blue laser) |
| Laser class | 2 | 3R |
| EMC test | as per EN 61000, EN IEC 61326-1, EN IEC 61326-2-2 |
| Electrical safety | as per EN 61 010-1 IEC TR 60721-4-3:2003 (3M4) |
| Laser safety inputs | 24 V DC +/- 15% |
| Vibration test | IEC 60068-2-6, 5-200Hz |
| Shock test | IEC TR 60721-4-3:2003 (3M4); IEC 60068-2-27 |
| Enclosure rating | IP67 |
| Air humidity | Maximum 90%, non-condensing |
| Temperature (operation | storage) | 0 – 40° C | -20 – 70° C |
| Compatible accessories | Power-I/O-Encoder cable: 6.320.0XX Ethernet cable: 6.303.0XX in 5 m or 10 m |
1 Scan rate & point rate are dependent on the configured field of view, measurement range and exposure time. The typical scan rate can be further boosted by binning.
Note: Typical values can vary up to 5% due to tolerances.